LPW Wafer Map Library, provides classes fro the wafer map synthesis, sorting, de/serialization and realtime display. More...

Data Structures
interface	ILDie
	This interface holds a single die and is used to access its properties. More...

interface	ILWaferMap
	This interface represent the wafer map, provide functionalities of the wafer map synthesize, serialization, display, die accessing and counting. More...

interface	ILWaferProps
	This interface holds the device information of the wafer. More...

interface	ILWaferSorter
	This interface provide functionalities of the wafer map sorting. More...

class	LDie

class	LWaferMap

class	LWaferProps

class	LWaferSorter

Enumerations
enum	LPWBinQuality { LPWBinNull = 0 , LPWBinRef = 1 , LPWBinMirror = 2 , LPWBinUgly = 3 , LPWBinEdge = 4 , LPWBinFail = 5 , LPWBinPass = 6 , LPWBinFirst = 7 , LPWBinSkip = 8 , LPWBinUnknown = 9 }
	This enumeration represents the quality of the bin. Binning is the process of assigning a bin code to each device on the wafer. More...

enum	LPWWaferMapDrawFlags { LPWWaferMapDrawWafer = 0x01 , LPWWaferMapDrawBin = 0x02 , LPWWaferMapDrawStreet = 0x04 , LPWWaferMapDrawSelected = 0x08 , LPWWaferMapDrawData = 0x10 , LPWWaferMapDrawDataHeatMap = 0x20 , LPWWaferMapDrawDefault = LPWWaferMapDrawBin + LPWWaferMapDrawStreet + LPWWaferMapDrawSelected , LPWWaferMapDrawAll = 0xff }
	This enumeration represents the flags to control the wafer map' drawing behavior. More...

Detailed Description

LPW Wafer Map Library, provides classes fro the wafer map synthesis, sorting, de/serialization and realtime display.

To include the definitions of the library's classes, use the following directive:

Enumeration Type Documentation

This enumeration represents the quality of the bin. Binning is the process of assigning a bin code to each device on the wafer.

Enumerator
LPWBinNull	The null/empty position
LPWBinRef	The reference die used for alignment. A reference die (also known as an alignment die) is one that the machine processing the wafer uses to properly align with the wafer map. It may or may not be a "good" die, but often it is visually distinct (and hence not a "good" die).
LPWBinMirror	The mirror die, which one is highly reflective – the equipment is able to find the mirror die from a full wafer view. The mirror die is often placed adjacent to a reference die.
LPWBinUgly	The ugly die is geometrically complete but bad or with no pattern, typically one which was either damaged during processing or is located in a region where it has been truncated.
LPWBinEdge	The edge die is geometrically incomplete die along wafer periphery, which is rejected because processing near the edge is not consistent.
LPWBinFail	The die failed at test/probe, will not be "picked" for further processing.
LPWBinPass	The die passed at test/probe/inspection and will be "picked" for further processing.
LPWBinFirst	The firstly probed die
LPWBinSkip	The die skipped at probing (within the probing area), sometimes assigned as NULL. For one reason or another, the probe machine has been instructed to skip testing of this die.
LPWBinUnknown	The un-inspected die

This enumeration represents the flags to control the wafer map' drawing behavior.

Enumerator
LPWWaferMapDrawWafer	Draw the wafer
LPWWaferMapDrawBin	Draw the bin using the specified color
LPWWaferMapDrawStreet	Draw the street lines
LPWWaferMapDrawSelected	Draw the current selection
LPWWaferMapDrawData	Draw the data value as text
LPWWaferMapDrawDataHeatMap	Draw the data of interest as heat map. The lower bound and smaller values are drawn as blue, then the middle values are green, finally the upper bound and larger values are red.
LPWWaferMapDrawDefault	Default draw flags, which draws only the bins, street and the selection
LPWWaferMapDrawAll	Draw the all components