ILWaferSorter Interface Reference

This interface provide functionalities of the wafer map sorting. More...

Inheritance diagram for ILWaferSorter:

Public Member Functions
void	AddDie (ILDie *dieItem)
void	AddDie2 (double x, double y, LPWBinQuality binQuality, double dieData)
LPVErrorCode	Realtime (ILWaferMap **realtimeWaferMap)
LPVErrorCode	Sort (ILWaferMap **sortedWaferMap)
Public Member Functions inherited from ILObject
ILObject *	Copy ()
LPVErrorCode	Load (LString filename)
void	Reset ()
LPVErrorCode	Save (LString filename)
BOOL	Valid ()

Properties
ILWaferMap	Template [get, set]
	The template wafer map. The realtime and final sorted wafer map is aligned to the template map, based on the transform of the corresponding reference dice and the general look of the dice array.

Detailed Description

This interface provide functionalities of the wafer map sorting.

The sorter collects the dice and put them to the nearest proper position onto the realtime wafer map. And in the final sorting, it optimizes the dice array globally, filtering the noisy or duplicated dices, then output the final sorted wafer map. The template wafer map must be specified before sorting, to make the sorter understand well the organization of the wafer.

To use this interface, you should create a LWaferSorter object.

Example Code

C++

ILWaferSorterPtr sorter = LWaferSorter::Create();
sorter->Template = templateMap;
// capture and add the reference dice, it helps to align the wafer map to the template
for (int i = 0; i < count; ++i) {
    sorter->AddDie2(x, y, LPWBinRef, 0);
}
// the nth capture
for (int i = 0; i < count; ++i) {
    sorter->AddDie2(x, y, LPWBinPass, 0);
}
// get the realtime wafer map
ILWaferMapPtr realtimeMap;
LPVErrorCode err = sorter->Realtime(&realtimeMap);
if (err != LPVErrorCode::LPVNoError) return;
// finished, get the final sorted wafer map
ILWaferMapPtr sortedMap;
err = sorter->Sort(&sortedMap);
if (err != LPVErrorCode::LPVNoError) return;

C#

LWaferSorter sorter = new LWaferSorter();
sorter.Template = templateMap;
// capture and add the reference dice, it helps to align the wafer map to the template
for (int i = 0; i < count; ++i) {
    sorter.AddDie2(x, y, LPWBinRef, 0);
}
// the nth capture
for (int i = 0; i < count; ++i) {
    sorter.AddDie2(x, y, LPWBinPass, 0);
}
// get the realtime wafer map
LWaferMap realtimeMap;
LPVErrorCode err = sorter.Realtime(out realtimeMap);
if (err != LPVErrorCode.LPVNoError) return;
// finished, get the final sorted wafer map
LWaferMap sortedMap;
err = sorter.Sort(out sortedMap);
if (err != LPVErrorCode.LPVNoError) return;

COM

ILWaferSorterPtr sorter = LWaferSorter::Create();
// or, ILWaferSorterPtr sorter(__uuidof(LWaferSorter)), for absence of built-in Create functions (before 2.2.0)
sorter->Template = templateMap;
// capture and add the reference dice, it helps to align the wafer map to the template
for (int i = 0; i < count; ++i) {
    sorter->AddDie2(x, y, LPWBinRef, 0);
}
// the nth capture
for (int i = 0; i < count; ++i) {
    sorter->AddDie2(x, y, LPWBinPass, 0);
}
// get the realtime wafer map
ILWaferMapPtr realtimeMap;
LPVErrorCode err = sorter->Realtime(&realtimeMap);
if (err != LPVErrorCode::LPVNoError) return;
// finished, get the final sorted wafer map
ILWaferMapPtr sortedMap;
err = sorter->Sort(&sortedMap);
if (err != LPVErrorCode::LPVNoError) return;

Member Function Documentation

AddDie()

void AddDie

(

ILDie *

dieItem

)

Add the new die object into the sorter.

Parameters

[in]

dieItem

The new die object.

See also

AddDie2()

AddDie2()

void AddDie2	(	double	x,
		double	y,
		LPWBinQuality	binQuality,
		double	dieData
	)

Add a new die object into the sorter, with the input position and bin.

Parameters

[in]	x	The x-coordinate of the die
[in]	y	The y-coordinate of the die
[in]	binQuality	The bin quality of the die. Please noted the reference die(LPWBinRef) will be used for alignment.
[in]	dieData	The optional custom data associated with the die. Use zero for all dice if it's unnecessary.

See also

AddDie()

Realtime()

LPVErrorCode Realtime

(

ILWaferMap **

realtimeWaferMap

)

Generate the realtime wafer map. It's usually used when the wafer map is not fully filled during scanning.
All dices are placed to the nearest position in the template wafer's array.
If any reference dice are available, the realtime map is aligned the template according to the transform of the corresponding reference dice. Thus, it's recommended to identify and add reference dice into sorter firstly before scanning.
This method is faster then final sorting Sort(), but may report wrong(missing or superfluous) bin.

Parameters

[out]

realtimeWaferMap

Output the realtime wafer map

Return values

error

Return error code if anything is wrong.

Sort()

LPVErrorCode Sort

(

ILWaferMap **

sortedWaferMap

)

Sort and generate the sorted wafer map. It's usually done when finished the scanning and used as the final result wafer map. All dices are arranged as array based their relative positions to the nearby dice. The duplicated or misaligned positions are filtered. The alignment to the template map is done based on the reference dice and general look of the entire wafer map.

Parameters

[out]

sortedWaferMap

Output the sorted wafer map

Return values

error

Return error code if anything is wrong.